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Fig. 3. Depth profiles of selected properties of disturbed soil from a simulated waste trench and of nearby undisturbed soil, at a location adjacent to the INEEL Subsurface Disposal Area (Nimmo et al., 1999).





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The SCI Journals Agronomy Journal Crop Science
Journal of Natural Resources
and Life Sciences Education
Soil Science Society of America Journal
Journal of Plant Registrations Journal of
Environmental Quality
The Plant Genome